Study of Thermal Conductivity of Porous Silicon Using the Micro-Raman Method

Ould-Abbas, Amaria and Bouchaour, Mama and Sari, Nasr-Eddine Chabane (2012) Study of Thermal Conductivity of Porous Silicon Using the Micro-Raman Method. Open Journal of Physical Chemistry, 02 (01). pp. 1-6. ISSN 2162-1969

[thumbnail of OJPC20120100008_64354174.pdf] Text
OJPC20120100008_64354174.pdf - Published Version

Download (1MB)

Abstract

In this work, we are interesting in the measurement of thermal conductivity (on the surface and in-depth) of Porous silicon by the micro-Raman spectroscopy. This direct method (micro-Raman spectroscopy) enabled us to develop a systematic means of investigation of the morphology and the thermal conductivity of Porous silicon oxidized or no. The thermal conductivity is studied according to the parameters of anodization and fraction of silicon oxidized. Thermal transport in the porous silicon layers is limited by its porous nature and the blocking of transport in the silicon skeleton what supports its use in the thermal sensors.

Item Type: Article
Subjects: STM Academic > Chemical Science
Depositing User: Unnamed user with email support@stmacademic.com
Date Deposited: 01 Jun 2023 09:35
Last Modified: 30 Jan 2024 06:58
URI: http://article.researchpromo.com/id/eprint/937

Actions (login required)

View Item
View Item